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GE FDEP--SEB 2 00 Probe Dual Crystal 2MHz 0° Ø20mm
This probe is used for detecting flaws within materials, measuring remaining wall thickness, and identifying near-surface defects. It is particularly effective in detecting core flaws in railroad wheels, shafts, bars, and billets.
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Operating at a frequency of 2 MHz, this probe features a dual crystal structure positioned at a 0° angle. With a diameter of 20 mm, it offers high precision and reliability.
Frequency: 2 MHz
Angle: 0°
Diameter: 20 mm
Applications: Corrosion, erosion, weld overlay testing, bond testing