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GE SE-Prüfkopf MSEB 2-E IKIZ PROB
This dual-element ultrasonic probe is used for material analysis and flaw detection. It is particularly suitable for detecting near-surface flaws and analyzing thin materials
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The GE SE-Prüfkopf MSEB 2-E operates at 2 MHz frequency. Its dual-element design ensures high-precision measurements
Frequency: 2 MHz
Type: Dual-element ultrasonic probe
Application: Material analysis and flaw detection